Scanning probe microscopy
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Scanning probe microscopy |
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Molecular nanotechnology |
Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position. SPM was founded with the invention of the scanning tunneling microscope in 1981.
Many scanning probe microscopes can image several interactions simultaneously. The manner of using these interactions to obtain an image is generally called a mode.
The resolution varies somewhat from technique to technique, but some probe techniques reach a rather impressive atomic resolution. They owe this largely to the ability of piezoelectric actuators to execute motions with a precision and accuracy at the atomic level or better on electronic command. One could rightly call this family of technique 'piezoelectric techniques'. The other common denominator is that the data are typically obtained as a two-dimensional grid of data points, visualized in false color as a computer image.
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[edit] Established types of scanning probe microscopy
- AFM, atomic force microscopy
- contact AFM
- non-contact AFM
- dynamic contact AFM
- BEEM, ballistic electron emission microscopy
- EFM, electrostatic force microscope
- ESTM electrochemical scanning tunneling microscope
- FMM, force modulation microscopy
- KPFM, kelvin probe force microscopy
- MFM, magnetic force microscopy
- MRFM, magnetic resonance force microscopy
- NSOM, near-field scanning optical microscopy (or SNOM, scanning near-field optical microscopy)
- PFM, Piezo Force Microscopy
- PSTM, photon scanning tunneling microscopy
- PTMS, photothermal microspectroscopy/microscopy
- SECM, scanning electrochemical microscopy
- SCM, scanning capacitance microscopy
- SGM, scanning gate microscopy
- SICM, scanning ion-conductance microscopy
- SPSM spin polarized scanning tunneling microscopy
- SThM, scanning thermal microscopy[1]
- STM, scanning tunneling microscopy
- SVM, scanning voltage microscopy
- SHPM, scanning Hall probe microscopy
[edit] Advantages of scanning probe microscopy
- The resolution of the microscopes is not limited by diffraction, but only by the size of the probe-sample interaction volume (i.e., point spread function), which can be as small as a few picometres. Hence the ability to measure small local differences in object height (like that of 135 picometre steps on <100> silicon) is unparalleled. Laterally the probe-sample interaction extends only across the tip atom or atoms involved in the interaction.
- The interaction can be used to modify the sample to create small structures (nanolithography).
- Unlike electron microscope methods, specimens do not require a partial vacuum but can be observed in air at standard temperature and pressure or while submerged in a liquid reaction vessel.
[edit] Disadvantages of scanning probe microscopy
- The detailed shape of the scanning tip is sometimes difficult to determine. Its effect on the resulting data is particularly noticeable if the specimen varies greatly in height over lateral distances of 10 nm or less.
- The scanning techniques are generally slower in acquiring images, due to the scanning process. As a result, efforts are being made to greatly improve the scanning rate. Like all scanning techniques, the embedding of spatial information into a time sequence opens the door to uncertainties in metrology, say of lateral spacings and angles, which arise due to time-domain effects like specimen drift, feedback loop oscillation, and mechanical vibration.
- The maximum image size is generally smaller.
- Scanning probe microscopy is often not useful for examining buried solid-solid or liquid-liquid interfaces.
[edit] Atomic Force Microscope Manufacturers
- Agilent Technologies
- Ångstrom Advanced Inc
- Asylum Research
- JPK Instruments
- Nanosurf
- Nanotec Electronica
- NT-MDT
- Omicron
- Pacific Nanotechnology
- Park Systems
- RHK Technology
- Surface Imaging Systems
- Veeco - Digital Instruments
[edit] Programs
- Gwyddion (image data analysis program) - http://gwyddion.net/ - A Software Framework for SPM Data Analysis.
- GXSM - Gnome X Scanning Microscopy.
- Mountains-SPM - Image processing and analysis from Digital Surf.
- SPIP - Scanning Probe Image Processor.
- WSxM - Free software for Scanning Probe Microscopy images analysis and representation
- XPMPro - Data acquisition, image processing and analysis from RHK Technology, Inc.
[edit] References
- "SPM - Scanning Probe Microscopy Website", JW Cross
- "Scanning Electrochemical Microscopy", A.J. Bard and M.V. Mirkin, Marcel Dekker, Inc., 2001.
- "Scanning Probe Microscopy: The Lab on a Tip", E. Meyer E., H.J. Hug, R. Bennewitz
- "AFM University", P. West
[edit] External links
- Scanning Probe Microscopy at the Institute of Food Research
- Characterization in nanotechnology some pdfs
- overview of STM/AFM/SNOM principles with educative videos
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